Effect of Polarization on Nonlinear Optical Properties of ZnO Thin Film

Authors

  • Tharaa Jirjees Polus Department of Physics, College of Education for Pure Sciences, Mosul University
  • Thoalfiqar Ali Zaker Department of Physics, College of Education, University of Al-Hamdaniya, Nineveh
  • Ammar Tahssen Zakar Department of Physics, College of Education for Pure Sciences
  • Yasir Hussein Mohammed Department of Physics, College of Education for Pure Sciences, Mosul University

DOI:

https://doi.org/10.54153/sjpas.2021.v3i4.315

Keywords:

ZnO thin films, Z-scan technique, Polarization, Nonlinear properties.

Abstract

The dependency of the 3rd order nonlinear optical properties of the Zinc Oxide (ZnO) thin films on laser light polarization were investigated with the widely known Z-scan technique. The measurements were taken at linearly, elliptically, and circularly polarized light at both P-polarization and S-polarization states. Pulse-wave red diode laser diode at repetition rate of 1 KHz, wavelength of 650 nm and maximum power of 3mW was used. The laser beam passes through a thin film sample with thickness of (425nm). The sample was deposited on the glass substrates using atmospheric pressure chemical vapor deposition (APCVD) technique. The measurements of NLR and NLA indicates that the linearly polarized light has the largest values. The circularly polarized light has the smallest values for both P- and S-polarization. Also, the ZnO thin films exhibit a better nonlinearity at S-polarization in comparison to P-polarization. The high nonlinearity can lead for using the material in many applications.

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Published

2021-12-30